机读格式显示(MARC)

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• 001 0000827630

• 003 CAL

• 005 20250816211500.0

• 008 211117s2022 flua b 001 0 eng

• 010 __ |a 2021056285

• 020 __ |a 9780367357948 |q hardback

• 020 __ |a 9781032246802

• 020 __ |z 9780429351662

• 040 __ |a DLC |b eng |e rda |c DLC |d FDU

• 042 __ |a pcc

• 050 00 |a QD131 |b .D66 2022

• 082 00 |a 543 |2 23/eng20220207

• 090 __ |a O657/X1

• 093 __ |a O657 |2 5

• 099 __ |a CAL 022023026270

• 100 1_ |a Dong, ZhiLi, |e author.

• 245 10 |a Fundamentals of crystallography, powder X-ray diffraction, and transmission electron microscopy for materials scientists / |c Dong ZhiLi.

• 250 __ |a First edition.

• 260 __ |a Boca Raton, FL : |b CRC Press, |c 2022.

• 300 __ |a xix, 266 pages : |b illustrations ; |c 24 cm.

• 336 __ |a text |b txt |2 rdacontent

• 337 __ |a unmediated |b n |2 rdamedia

• 338 __ |a volume |b nc |2 rdacarrier

• 490 0_ |a Advances in materials science and engineering

• 504 __ |a Includes bibliographical references and index.

• 520 __ |a "The goal of this textbook is to effectively equip readers with an in-depth understanding of crystallography, x-ray diffraction, and transmission electron microscopy theories as well as applications. Written as an introduction to the topic with minimal reliance on advanced mathematics, the book will appeal to a broad spectrum of readers, including students, engineers, and researchers in materials science and engineering, applied physics, and chemical engineering. It can be used in XRD and TEM lab training"--

• 650 _0 |a Materials |x Analysis.

• 650 _0 |a Crystallography.

• 650 _0 |a X-ray diffraction imaging.

• 650 _0 |a Transmission electron microscopy.