机读格式显示(MARC)

• 000 01262cam a2200349 i 4500

• 001 0000836574

• 003 OCoLC

• 005 20250908135400.0

• 008 160823s2016 sz a b 001 0 eng d

• 020 __ |a 9783319402093 |q (print)

• 020 __ |a 3319402099 |q (print)

• 020 __ |a 9783319402109 |q (electronic bk.)

• 020 __ |a 3319402102 |q (electronic bk.)

• 035 __ |a (OCoLC)957156891 |z (OCoLC)957615447 |z (OCoLC)961205503

• 040 __ |a N$T |b eng |e rda |c N$T |d IDEBK |d EBLCP |d GW5XE |d YDX |d N$T |d OCLCF |d IDB |d UAB

• 050 _4 |a TA169.6

• 082 04 |a 620/.0045 |2 23

• 090 __ |a TB24/X1

• 093 __ |a TB24 |2 5

• 245 00 |a Knowledge-driven board-level functional fault diagnosis / |c Fangming Ye, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu

• 260 __ |a Switzerland : |b Springer, |c [2016]

• 300 __ |a xiii, 147 pages : |b illustrations (some color) ; |c 24 cm.

• 336 __ |a text |b txt |2 rdacontent

• 337 __ |a unmediated |b n |2 rdamedia

• 338 __ |a volume |b nc |2 rdacarrier

• 504 __ |a Includes bibliographical references and index

• 650 _0 |a Fault location (Engineering)

• 650 _0 |a Fault tolerance (Engineering)

• 700 1_ |a Ye, Fangming, |e author.

• 700 1_ |a Zhang, Zhaobo, |e author.

• 700 1_ |a Chakrabarty, Krishnendu, |e author.

• 700 1_ |a Gu, Xinli, |e author.