机读格式显示(MARC)

• 000 01090cam a2200313 i 4500

• 001 0000849015

• 003 CAL

• 005 20251128145000.0

• 008 170925s2017 enka b 001 0 eng d

• 020 __ |a 1848215770

• 020 __ |a 9781848215771

• 040 __ |a YDX |b eng |e rda |c YDX |d OCLCO |d ZWZ

• 050 _4 |a QC702.7.B65 |b J35 2017

• 090 __ |a O572/X1

• 093 __ |a O572 |2 5

• 099 __ |a CAL 022017140044

• 100 1_ |a Jalabert, Denis, |e author.

• 245 10 |a Swift ion beam analysis in nanosciences / |c Denis Jalabert, Ian Vickridge, Amal Chabli.

• 260 __ |a London, UK : |b ISTE, Ltd. ; |a Hoboken, NJ : |b Wiley, |c 2017.

• 300 __ |a xvii, 258 pages : |b illustrations ; |c 25 cm.

• 336 __ |a text |b txt |2 rdacontent

• 337 __ |a unmediated |b n |2 rdamedia

• 338 __ |a volume |b nc |2 rdacarrier

• 490 1_ |a Nanoscience and nanotechnology series

• 504 __ |a Includes bibliographical references (pages 237-255) and index.

• 650 _0 |a Ion bombardment |x Industrial applications.

• 700 1_ |a Vickridge, Ian, |e author.

• 700 1_ |a Chabli, Amal, |e author.

• 830 _0 |a Nanoscience and nanotechnology series.