机读格式显示(MARC)

• 000 00986nam a2200265 i 4500

• 001 0000836920

• 005 20250907193800.0

• 008 150124s2015 nyua f ab 001 0 eng d

• 020 __ |a 9781606504673

• 040 __ |a CaBNVSL |b eng |e rda |c CaBNVSL |d CaBNVSL

• 050 _4 |a TA418.74 |b .S856 2015

• 082 04 |a 620.11223 |2 23

• 090 __ |a TB304/X1

• 093 __ |a TB304 |2 5

• 100 1_ |a Swingler, Jonathan., |e author.

• 245 14 |a The physics of degradation in engineered materials and devices : |b fundamentals and principles / |c edited by Jonathan Swingler ; with major contribution by Alec Feinberg.

• 260 __ |a New York, NY : |b Momentum Press, |c 2015.

• 300 __ |a xiv, 190 pages : |b illustrations ; |c 24 cm

• 336 __ |a text |2 rdacontent

• 337 __ |a unmediated |2 rdamedia

• 338 __ |a volume |2 rdacarrier

• 490 1_ |a Materials properties and behavior collection

• 504 __ |a Includes bibliographical references and index.

• 650 _0 |a Materials |x Deterioration.

• 700 1_ |a Feinberg, Alec., |e author.