机读格式显示(MARC)

• 000 01439nam a2200265 a 4500

• 001 0000838586

• 005 20250906082900.0

• 008 101102s2011 flua b 001 0 eng

• 010 __ |a 2010043713

• 020 __ |a 9781439821404 (hbk.)

• 040 __ |a DLC |c DLC |d NPU

• 042 __ |a pcc

• 050 00 |a TK7895.E42 |b P738 2010

• 082 00 |a 004.16 |2 22

• 090 __ |a TP303/X2

• 093 __ |a TP303 |2 4

• 099 __ |a CAL 022011292189

• 100 1_ |a Pries, Kim H., |d 1955-

• 245 10 |a Testing complex and embedded systems / |c Kim H. Pries, Jon M. Quigley.

• 260 __ |a Boca Raton, FL : |b CRC Press, |c 2011.

• 300 __ |a xxxi, 287 p. : |b ill. : |c 24 cm.

• 504 __ |a Includes bibliographical references (p. 281) and index.

• 520 __ |a "Using combinatorial approaches, this book aims to motivate testers and testing organizations to perform meaningful testing. The text details planning activities prior to testing, how to scope the work, and how to achieve a successful conclusion. Rather than presenting the entire continuum of testing for a particular product or design attribute, this volume focuses on boundary conditions. The authors provide various techniques that can be used to streamline testing and help identify problems before they occur, including turbocharge testing methods from Six Sigma. Coverage includes testing, simulation, and emulation"-- Provided by publisher.

• 650 _0 |a Embedded computer systems |x Testing.

• 700 1_ |a Quigley, Jon M.