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西文图书1.EMF effects from power sources and electrosmog / O441.4/X2
馆藏复本:1
可借复本:1 William J. Rea.
CRC Press, Taylor & Francis Group, [2022]
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西文图书2.Recent advancements in software reliability assurance / TP311.5/X5
馆藏复本:1
可借复本:1 edited by Adarsh Anand, Mangey Ram.
CRC Press, Taylor & Francis Group, [2019]
(0) 馆藏

