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Online Public Access Catalogue

题名/责任者:

Testing complex and embedded systems / Kim H. Pries, Jon M. Quigley.

出版发行项:

Boca Raton, FL : CRC Press, 2011.

ISBN:

9781439821404 (hbk.)

载体形态项:

xxxi, 287 p. : ill. : 24 cm.

个人责任者:

Pries, Kim H., 1955-

附加个人名称:

Quigley, Jon M.

论题主题:

Embedded computer systems-Testing.

中图法分类号:

TP303

书目附注:

Includes bibliographical references (p. 281) and index.

摘要附注:

"Using combinatorial approaches, this book aims to motivate testers and testing organizations to perform meaningful testing. The text details planning activities prior to testing, how to scope the work, and how to achieve a successful conclusion. Rather than presenting the entire continuum of testing for a particular product or design attribute, this volume focuses on boundary conditions. The authors provide various techniques that can be used to streamline testing and help identify problems before they occur, including turbocharge testing methods from Six Sigma. Coverage includes testing, simulation, and emulation"-- Provided by publisher.

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