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MARC状态:订购 文献类型:西文图书 浏览次数:6

题名/责任者:
Atomic force microscopy : fundamental concepts and laboratory investigations / Wesley C. Sanders.
出版发行项:
Boca Raton, FL : CRC, PressTaylor & Francis Group, [2020]
出版发行项:
2020
ISBN:
9780367218645
ISBN:
9780367371234
载体形态项:
xiii, 139 pages ; 25 cm
个人责任者:
Sanders, Wesley Crowell, author.
论题主题:
Atomic force microscopy.
中图法分类号:
TH742
书目附注:
Includes bibliographical references and index.
摘要附注:
This book focuses primarily on the atomic force microscope, and serves as a reference for students, postdocs, and researchers using atomic force microscopes for the first time. In addition, this book can serve as the primary text for a semester long, introductory course in atomic force microscopy. There are a few algebra-based mathematical relationships included in this book that describe the mechanical properties, behaviors, and intermolecular forces associated with probes used in atomic force microscopy. To add, relevant figures, tables, and illustrations are in each chapter in an effort to provide additional information and interest. This book includes suggested laboratory investigations that provide an opportunity to explore the versatility of the atomic force microscope. These laboratory exercises include opportunities for experimenters to explore force curves, surface roughness, friction loops, conductivity imaging, and phase imaging.
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